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[IEEE Comput. Soc. Press 3rd International Conference on Document Analysis and Recognition - Montreal, Que., Canada (14-16 Aug. 1995)] Proceedings of 3rd International Conference on Document Analysis and Recognition - A knowledge-based approach to the layout analysis

✍ Scribed by Esposito, F.; Malerba, D.; Semeraro, G.

Book ID: 121197219
Publisher: IEEE Comput. Soc. Press
Year: 1995
Weight: 739 KB
Volume: 1
Category: Article
ISBN-13: 9780818671289
DOI: 10.1109/ICDAR.1995.599037

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