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[IEEE Comput. Soc. Press 2nd Working Conference on Reverse Engineering - Toronto, Ont., Canada (14-16 July 1995)] Proceedings of 2nd Working Conference on Reverse Engineering - Pattern matching for design concept localization

✍ Scribed by Kontogiannis, K.; DeMori, R.; Bernstein, M.; Galler, M.; Merlo, E.

Book ID: 124161596
Publisher: IEEE Comput. Soc. Press
Year: 1995
Weight: 680 KB
Category: Article
ISBN-13: 9780818671111
DOI: 10.1109/WCRE.1995.514698

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