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[IEEE Comput. Soc. Press 2nd International Conference on Document Analysis and Recognition (ICDAR '93) - Tsukuba Science City, Japan (20-22 Oct. 1993)] Proceedings of 2nd International Conference on Document Analysis and Recognition (ICDAR '93) - Document image defect models and their uses

✍ Scribed by Baird, H.S.

Book ID: 111950109
Publisher: IEEE Comput. Soc. Press
Year: 1993
Tongue: English
Weight: 640 KB
Volume: 0
Category: Article
ISBN-13: 9780818649608
DOI: 10.1109/icdar.1993.395781

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✦ Synopsis

Sponsored By The Iapr Tc-11 And Tc-10 In Cooperation With The Ieee Computer Society And Igs. Ieee Catalog Number 93th0578-5--t.p. Verso. Includes Bibliographical References And Index.

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