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[IEEE Comput. Soc. Press 1994 IEEE International Symposium on Software Reliability Engineering - Monterey, CA, USA (6-9 Nov. 1994)] Proceedings of 1994 IEEE International Symposium on Software Reliability Engineering - Mutation analysis testing for finite state machines

✍ Scribed by Pinto Ferraz Fabbri, S.C.; Delamaro, M.E.; Maldonado, J.C.; Masiero, P.C.

Book ID: 120881491
Publisher: IEEE Comput. Soc. Press
Year: 1994
Tongue: English
Weight: 644 KB
Category: Article
ISBN-13: 9780818666650
DOI: 10.1109/ISSRE.1994.341378

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