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[IEEE Comput. Soc. Press [1992] International Conference on Wafer Scale Integration - San Francisco, CA, USA (22-24 Jan. 1992)] [1992] Proceedings International Conference on Wafer Scale Integration - Yield optimization of redundant multimegabit RAM's using the center-satellite model

✍ Scribed by Das Sharma, D.; Meyer, F.J.; Pradhan, D.K.

Book ID: 126764660
Publisher: IEEE Comput. Soc. Press
Year: 1992
Weight: 446 KB
Category: Article
ISBN-13: 9780818624827
DOI: 10.1109/ICWSI.1992.171812

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