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[IEEE Comput. Soc. Press 1990 IEEE International Conference on Computer-Aided Design. Digest of Technical Papers - Santa Clara, CA, USA (11-15 Nov. 1990)] 1990 IEEE International Conference on Computer-Aided Design. Digest of Technical Papers - Design for circuit quality: yield maximization, minimax, and Taguchi approach

✍ Scribed by Styblinski, M.A.

Book ID: 115529159
Publisher: IEEE Comput. Soc. Press
Year: 1990
Weight: 401 KB
Volume: 0
Category: Article
ISBN-13: 9780818620553
DOI: 10.1109/iccad.1990.129855

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