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[IEEE Comput. Soc. Press [1989] 1st European Test Conference - Paris, France (12-14 April 1989)] [1989] Proceedings of the 1st European Test Conference - Timing accuracy in VLSI testing

✍ Scribed by Pavlik, E.; Vuksic, A.

Book ID: 125491004
Publisher: IEEE Comput. Soc. Press
Year: 1989
Tongue: English
Weight: 344 KB
Category: Article
ISBN-13: 9780818619373
DOI: 10.1109/ETC.1989.36229

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