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[IEEE Comput. Soc. Press 12th International Conference on Pattern Recognition - Jerusalem, Israel (9-13 Oct. 1994)] Proceedings of 12th International Conference on Pattern Recognition - Corner detection using the MAP technique

✍ Scribed by Xining Zhang, ; Haralick, R.M.; Ramesh, V.

Book ID: 126764653
Publisher: IEEE Comput. Soc. Press
Year: 1994
Tongue: English
Weight: 351 KB
Volume: 1
Category: Article
ISBN-13: 9780818662652
DOI: 10.1109/ICPR.1994.576354

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