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[IEEE Comput. Soc. Press 10th International Conference on Pattern Recognition - Atlantic City, NJ, USA (16-21 June 1990)] [1990] Proceedings. 10th International Conference on Pattern Recognition - A modeling approach to feature selection

✍ Scribed by Sheinvald, J.; Dom, B.; Niblack, W.

Book ID: 120724836
Publisher: IEEE Comput. Soc. Press
Year: 1990
Weight: 418 KB
Volume: i
Category: Article
ISBN-13: 9780818620621
DOI: 10.1109/ICPR.1990.118160

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