[IEEE Comput. Soc International Symposium on Technology and Society - Stamford, CT, USA (6-7 July 2001)] Proceedings International Symposium on Technology and Society - Ethics, law and technology: a case study in computer-mediated communication

[IEEE 1999 International Symposium on Te

[IEEE 1999 International Symposium on Technology and Society - Women and Technology: Historical, Societal, and Professional Perspectives - New Brunswick, NJ, USA (29-31 July 1999)] 1999 International Symposium on Technology and Society - Women and Technology: Historical, Societal, and Professional Perspectives. Proceedings. Networking the World (Cat. No.99CH37005) - Computers, ethics, law and society: what do we teach undergraduates?

✍ Sedlet, S. 📂 Article 📅 1999 🏛 IEEE ⚖ 433 KB

[IEEE 2002 International Symposium on Te

[IEEE 2002 International Symposium on Technology and Society (ISTAS'02). Social Implications of Information and Communication Technology - Raleigh, NC, USA (6-8 June 2002)] IEEE 2002 International Symposium on Technology and Society (ISTAS'02). Social Implications of Information and Communication Technology. Proceedings (Cat. No.02CH37293) - "Daddy, daddy, my computer has a fever!" Children and communication technologies in everyday life

✍ Oksman, V. 📂 Article 📅 2002 🏛 IEEE 🌐 English ⚖ 290 KB

Sponsored By: The Ieee Society On Social Implications Of Technology ... [et Al.]. Ieee Catalog Number 02ch37293--t.p. Verso. Includes Bibliographical References And Author Index. Also Available Via The World Wide Web With Additional Title: Technology And Society, 2002, (istas'02), 2002 International

[IEEE 2002 International Symposium on Te

[IEEE 2002 International Symposium on Technology and Society (ISTAS'02). Social Implications of Information and Communication Technology - Raleigh, NC, USA (6-8 June 2002)] IEEE 2002 International Symposium on Technology and Society (ISTAS'02). Social Implications of Information and Communication Technology. Proceedings (Cat. No.02CH37293) - Ethical hacking: the security justification redux

✍ Smith, B.; Yurcik, W.; Doss, D. 📂 Article 📅 2002 🏛 IEEE 🌐 English ⚖ 416 KB

Sponsored By: The Ieee Society On Social Implications Of Technology ... [et Al.]. Ieee Catalog Number 02ch37293--t.p. Verso. Includes Bibliographical References And Author Index. Also Available Via The World Wide Web With Additional Title: Technology And Society, 2002, (istas'02), 2002 International

[IEEE 2002 International Symposium on Te

[IEEE 2002 International Symposium on Technology and Society (ISTAS'02). Social Implications of Information and Communication Technology - Raleigh, NC, USA (6-8 June 2002)] IEEE 2002 International Symposium on Technology and Society (ISTAS'02). Social Implications of Information and Communication Technology. Proceedings (Cat. No.02CH37293) - Teaching Ethics and the Internet 2.0: pervasive computing, consumer electronics and progressive embodiment

✍ Robinson, W. 📂 Article 📅 2002 🏛 IEEE 🌐 English ⚖ 538 KB

Sponsored By: The Ieee Society On Social Implications Of Technology ... [et Al.]. Ieee Catalog Number 02ch37293--t.p. Verso. Includes Bibliographical References And Author Index. Also Available Via The World Wide Web With Additional Title: Technology And Society, 2002, (istas'02), 2002 International

[IEEE 2002 International Symposium on Te

[IEEE 2002 International Symposium on Technology and Society (ISTAS'02). Social Implications of Information and Communication Technology - Raleigh, NC, USA (6-8 June 2002)] IEEE 2002 International Symposium on Technology and Society (ISTAS'02). Social Implications of Information and Communication Technology. Proceedings (Cat. No.02CH37293) - A research information portal for telecommunications

✍ Zimmermann, K. 📂 Article 📅 2002 🏛 IEEE ⚖ 430 KB

[IEEE Comput. Soc 2001 IEEE Internationa

[IEEE Comput. Soc 2001 IEEE International Workshop on Memory Technology, Design and Testing - San Jose, CA, USA (6-7 Aug. 2001)] Proceedings 2001 IEEE International Workshop on Memory Technology, Design and Testing - A parallel approach for testing multi-port static random access memories

✍ Karimi, F.; Irrinki, S.; Crosbuy, T.; Lombardi, F. 📂 Article 📅 2001 🏛 IEEE Comput. Soc 🌐 English ⚖ 680 KB

The 14 papers in this collection from the August 2001 workshop are divided into five sessions on semiconductor memory design, BIST, redundancy and error control, fault models and multi-port SRAM testing, and verification and testing. Some of the topics are evaluation of redundancy analysis algorithm