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[IEEE Comput. Soc International Conference on Image Processing - Santa Barbara, CA, USA (26-29 Oct. 1997)] Proceedings of International Conference on Image Processing - Wavelet methods for texture defect detection

✍ Scribed by Lambert, G.; Bock, F.

Book ID: 126088750
Publisher: IEEE Comput. Soc
Year: 1997
Weight: 868 KB
Edition: 1997
Volume: 3
Category: Article
ISBN-13: 9780818681837
DOI: 10.1109/ICIP.1997.632054

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