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[IEEE Comput. Soc IEEE European Test Workshop - Cascais, Portugal (23-26 May 2000)] Proceedings IEEE European Test Workshop - Fast and low-area TPGs based on T-type flip-flops can be easily integrated to the scan path
✍ Scribed by Garbolino, T.; Hlawiczka, A.; Kristof, A.
- Book ID
- 126692946
- Publisher
- IEEE Comput. Soc
- Year
- 2000
- Weight
- 551 KB
- Category
- Article
- ISBN-13
- 9780769507019
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