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[IEEE Comput. Soc Eleventh International Conference on VLSI Design - Chennai, India (4-7 Jan. 1998)] Proceedings Eleventh International Conference on VLSI Design - Automated AC (timing) characterization for digital circuit testing

✍ Scribed by Balajee, S.; Majhi, A.K.

Book ID: 125811170
Publisher: IEEE Comput. Soc
Year: 1998
Weight: 367 KB
Category: Article
ISBN-13: 9780818682247
DOI: 10.1109/ICVD.1998.646636

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