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[IEEE Comput. Soc Design, Automation and Test in Europe Conference and Exhibition, 1999. Proceedings - Munich, Germany (9-12 March 1999)] Design, Automation and Test in Europe Conference and Exhibition, 1999. Proceedings (Cat. No. PR00078) - On programmable memory built-in self test architectures

✍ Scribed by Zarrineh, K.; Upadhyaya, S.J.

Book ID: 121182664
Publisher: IEEE Comput. Soc
Year: 1999
Tongue: English
Weight: 181 KB
Edition: 1999
Category: Article
ISBN-13: 9780769500782
DOI: 10.1109/DATE.1999.761207

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