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[IEEE Comput. Soc AIPR 2000, 29th Applied Imagery Pattern Recognition Workshop - Washington, DC, USA (16-18 Oct. 2000)] Proceedings 29th Applied Imagery Pattern Recognition Workshop - Development of mammogram computer-aided diagnosis systems using optical processing technology

✍ Scribed by Lindell, S.; Shapiro, G.; Weil, K.; Flannery, ; Levy, J.; Wei Qian,

Book ID: 126657391
Publisher: IEEE Comput. Soc
Year: 2000
Tongue: English
Weight: 779 KB
Edition: 29
Category: Article
ISBN-13: 9780769509785
DOI: 10.1109/AIPRW.2000.953622

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