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[IEEE Comput. Soc 9th International IEEE On-Line Testing Symposium - Kos Island, Greece (7-9 July 2003)] 9th IEEE On-Line Testing Symposium, 2003. IOLTS 2003. - The positive effect on IC yield of embedded fault tolerance for SEUs

✍ Scribed by Nieuwland, A.K.; Kleihorst, R.P.

Book ID: 126638427
Publisher: IEEE Comput. Soc
Year: 2003
Weight: 378 KB
Category: Article
ISBN-13: 9780769519685
DOI: 10.1109/OLT.2003.1214370

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