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[IEEE Comput. Soc 9th International IEEE On-Line Testing Symposium - Kos Island, Greece (7-9 July 2003)] 9th IEEE On-Line Testing Symposium, 2003. IOLTS 2003. - Accurate and efficient analysis of single event transients in VLSI circuits

✍ Scribed by Sonza Reorda, M.; Violante, M.

No coin nor oath required. For personal study only.

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