✦ LIBER ✦
[IEEE Comput. Soc 8th IEEE European Test Workshop (ETW 03) - Maastricht, Netherlands (25-28 May 2003)] The Eighth IEEE European Test Workshop, 2003. Proceedings. - Automatic worst case pattern generation using neural networks & genetic algorithm for estimation of switching noise on power supply lines in CMOS circuits
✍ Scribed by Liau, E.; Schmitt-Landsiedel, D.
- Book ID
- 121082530
- Publisher
- IEEE Comput. Soc
- Year
- 2003
- Weight
- 224 KB
- Category
- Article
- ISBN-13
- 9780769519081
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