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[IEEE Comput. Soc 6th IEEE International On-Line Testing Workshop - Palma de Mallorca, Spain (3-5 July 2000)] Proceedings 6th IEEE International On-Line Testing Workshop (Cat. No.PR00646) - Relation between fault tolerance and reconfiguration in cellular systems

✍ Scribed by Sekanina, L.; Drabek, V.

Book ID: 126677614
Publisher: IEEE Comput. Soc
Year: 2000
Weight: 164 KB
Edition: 2000
Category: Article
ISBN-13: 9780769506463
DOI: 10.1109/OLT.2000.856607

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