[IEEE Comput. Soc 6th Design Automation and Test in Europe (DATE 03) - Munich, Germany (3-7 March 2003)] 2003 Design, Automation and Test in Europe Conference and Exhibition - Using formal techniques to debug the AMBA system-on-chip bus protocol

[IEEE Comput. Soc 6th Design Automation

✍ Roychoudhury, Abhik (author);Mitra, Tulika (author);Karri, S. R. (author) 📂 Article 📅 2003 🏛 IEEE Comput. Soc 🌐 English ⚖ 250 KB

The two volumes of this proceedings (of the Design, Automation, and Test in Europe Conference held in Munich, Germany in March 2003) feature the designers' forum in v.1 and nearly 1200 pages of proceedings in v.2. Among the topics of the designers' forum are design case studies, embedded operating s

[IEEE Comput. Soc 6th Design Automation

[IEEE Comput. Soc 6th Design Automation and Test in Europe (DATE 03) - Munich, Germany (3-7 March 2003)] 2003 Design, Automation and Test in Europe Conference and Exhibition - RTOS modeling for system level design

✍ Gerstlauer, A.; Haobo Yu, ; Gajski, D.D. 📂 Article 📅 2003 🏛 IEEE Comput. Soc 🌐 English ⚖ 261 KB

The two volumes of this proceedings (of the Design, Automation, and Test in Europe Conference held in Munich, Germany in March 2003) feature the designers' forum in v.1 and nearly 1200 pages of proceedings in v.2. Among the topics of the designers' forum are design case studies, embedded operating s

[IEEE Comput. Soc 6th Design Automation

[IEEE Comput. Soc 6th Design Automation and Test in Europe (DATE 03) - Munich, Germany (3-7 March 2003)] 2003 Design, Automation and Test in Europe Conference and Exhibition - SPIN: a scalable, packet switched, on-chip micro-network

✍ Adriahantenaina, A.; Charlery, H.; Greiner, A.; Mortiez, L.; Zeferino, C.A. 📂 Article 📅 2003 🏛 IEEE Comput. Soc 🌐 English ⚖ 233 KB

The two volumes of this proceedings (of the Design, Automation, and Test in Europe Conference held in Munich, Germany in March 2003) feature the designers' forum in v.1 and nearly 1200 pages of proceedings in v.2. Among the topics of the designers' forum are design case studies, embedded operating s

[IEEE Comput. Soc 6th Design Automation

[IEEE Comput. Soc 6th Design Automation and Test in Europe (DATE 03) - Munich, Germany (3-7 March 2003)] 2003 Design, Automation and Test in Europe Conference and Exhibition - A new approach to test generation and test compaction for scan circuits

✍ Pomeranz, I.; Reddy, S.M. 📂 Article 📅 2003 🏛 IEEE Comput. Soc 🌐 English ⚖ 241 KB

The two volumes of this proceedings (of the Design, Automation, and Test in Europe Conference held in Munich, Germany in March 2003) feature the designers' forum in v.1 and nearly 1200 pages of proceedings in v.2. Among the topics of the designers' forum are design case studies, embedded operating s

[IEEE Comput. Soc 6th Design Automation

[IEEE Comput. Soc 6th Design Automation and Test in Europe (DATE 03) - Munich, Germany (3-7 March 2003)] 2003 Design, Automation and Test in Europe Conference and Exhibition - Exploiting loop-level parallelism on coarse-grained reconfigurable architectures using modulo scheduling

✍ Bingfeng Mei, ; Vernalde, S.; Verkest, D.; De Man, H.; Lauwereins, R. 📂 Article 📅 2003 🏛 IEEE Comput. Soc 🌐 English ⚖ 273 KB

The two volumes of this proceedings (of the Design, Automation, and Test in Europe Conference held in Munich, Germany in March 2003) feature the designers' forum in v.1 and nearly 1200 pages of proceedings in v.2. Among the topics of the designers' forum are design case studies, embedded operating s

[IEEE Comput. Soc 6th Design Automation

[IEEE Comput. Soc 6th Design Automation and Test in Europe (DATE 03) - Munich, Germany (3-7 March 2003)] 2003 Design, Automation and Test in Europe Conference and Exhibition - Hierarchical global floorplacement using simulated annealing and network flow area migration

✍ Wonjoon Choi, ; Bazargan, K. 📂 Article 📅 2003 🏛 IEEE Comput. Soc 🌐 English ⚖ 254 KB

The two volumes of this proceedings (of the Design, Automation, and Test in Europe Conference held in Munich, Germany in March 2003) feature the designers' forum in v.1 and nearly 1200 pages of proceedings in v.2. Among the topics of the designers' forum are design case studies, embedded operating s

[IEEE Comput. Soc 6th Design Automation and Test in Europe (DATE 03) - Munich, Germany (3-7 March 2003)] 2003 Design, Automation and Test in Europe Conference and Exhibition - Using formal techniques to debug the AMBA system-on-chip bus protocol

✦ Synopsis