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[IEEE Comput. Soc 29th Annual International Symposium on Fault-Tolerant Computing - Madison, WI, USA (15-18 June 1999)] Digest of Papers. Twenty-Ninth Annual International Symposium on Fault-Tolerant Computing (Cat. No.99CB36352) - Reducing test application time for full scan embedded cores

โœ Scribed by Hamzaoglu, I.; Patel, J.H.


Book ID
121083300
Publisher
IEEE Comput. Soc
Year
1999
Weight
207 KB
Category
Article
ISBN-13
9780769502137

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