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[IEEE Comput. Soc 2000 IEEE/ACM International Workshop on Behavioral Modeling and Simulation - Orlando, FL, USA (19-20 Oct. 2000)] Proceedings 2000 IEEE/ACM International Workshop on Behavioral Modeling and Simulation - Combining models of physical effects for describing complex electromechanical devices

✍ Scribed by Vosskamper, L.M.; Schmid, R.; Pelz, G.

Book ID: 126664335
Publisher: IEEE Comput. Soc
Year: 2000
Weight: 379 KB
Category: Article
ISBN-13: 9780769508931
DOI: 10.1109/BMAS.2000.888363

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