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[IEEE Comput. Soc 15th International Conference on Pattern Recognition - Barcelona, Spain (3-7 Sept. 2000)] Proceedings 15th International Conference on Pattern Recognition. ICPR-2000 - Automatic flaw detection in textiles using a Neyman-Pearson detector

โœ Scribed by Mamic, G.; Bennamoun, M.


Book ID
118267554
Publisher
IEEE Comput. Soc
Year
2000
Weight
594 KB
Volume
4
Category
Article
ISBN-13
9780769507507

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