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[IEEE Comput. Soc 14th International Conference on VLSI Design - Bangalore, India (3-7 Jan. 2001)] VLSI Design 2001. Fourteenth International Conference on VLSI Design - Testable design of sequential circuits with improved fault efficiency

โœ Scribed by Das, D.K.; Bhattacharya, B.B.; Ohtake, S.; Fujiwara, H.


Book ID
118141260
Publisher
IEEE Comput. Soc
Year
2001
Weight
563 KB
Volume
0
Category
Article
ISBN-13
9780769508313

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