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[IEEE COMMAD 2000 Conference on Optoelectronic amd Microelectronic Materials and Devices - Bundoora, Vic., Australia (6-8 Dec. 2000)] COMMAD 2000 Proceedings. Conference on Optoelectronic and Microelectronic Materials and Devices - Temperature stability of HgCdTe n-on-p junctions formed by reactive ion etching

✍ Scribed by White, J.K.; Antoszewski, J.; Musca, C.A.; Dell, J.M.; Faraone, L.; Burke, P.

Book ID: 120218377
Publisher: IEEE
Year: 2000
Weight: 360 KB
Category: Article
ISBN-13: 9780780366985
DOI: 10.1109/COMMAD.2000.1022895

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