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[IEEE CICC Custom Integrated Circuits Conference - San Jose, CA, USA (21-24 Sept. 2003)] Proceedings of the IEEE 2003 Custom Integrated Circuits Conference, 2003. - Measurements and analysis of SER tolerant latch in a 90 nm dual-Vt CMOS process

✍ Scribed by Hazucha, P.; Karnik, T.; Walstra, S.; Bloechel, B.; Tschanz, J.; Maiz, J.; Soumyanath, K.; Dermer, G.; Narendra, S.; De, V.; Borkar, S.

Book ID: 121223760
Publisher: IEEE
Year: 2003
Weight: 279 KB
Category: Article
ISBN-13: 9780780378421
DOI: 10.1109/CICC.2003.1249472

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