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[IEEE CICC Custom Integrated Circuits Conference - San Jose, CA, USA (21-24 Sept. 2003)] Proceedings of the IEEE 2003 Custom Integrated Circuits Conference, 2003. - The impact of device type and sizing on phase noise mechanisms [MOS VCOs]

✍ Scribed by Jerng, A.; Sodini, C.G.

Book ID: 118263981
Publisher: IEEE
Year: 2003
Weight: 288 KB
Volume: 0
Category: Article
ISBN-13: 9780780378421
DOI: 10.1109/cicc.2003.1249457

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