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[IEEE CEIDP '05. 2005 Annual Report Conference on Electrical Insulation and Dielectric Phenomena, 2005. - Nashville, TN, USA (Oct. 16-19, 2005)] CEIDP '05. 2005 Annual Report Conference on Electrical Insulation and Dielectric Phenomena, 2005. - Electron collision cross-sections in mono-silane (SiH/sub 4/) molecule: an investigation and analysis

✍ Scribed by Ul Haq, S.

Book ID: 111941094
Publisher: IEEE
Year: 2005
Weight: 864 KB
Volume: 0
Category: Article
ISBN-13: 9780780392571
DOI: 10.1109/ceidp.2005.1560615

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