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[IEEE CAS 2001 International Semiconductor Conference - Sinaia, Romania (9-13 Oct. 2001)] 2001 International Semiconductor Conference. CAS 2001 Proceedings (Cat. No.01TH8547) - Silicon diode electrical characteristics under electron-beam irradiation conditions - experiments and theoretical interpretation

✍ Scribed by Codreanu, C.; Iliescu, E.; Obreja, V.

Book ID: 120072655
Publisher: IEEE
Year: 2001
Weight: 322 KB
Edition: 24
Category: Article
ISBN-13: 9780780366664
DOI: 10.1109/SMICND.2001.967510

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