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[IEEE CAS 2001 International Semiconductor Conference - Sinaia, Romania (9-13 Oct. 2001)] 2001 International Semiconductor Conference. CAS 2001 Proceedings (Cat. No.01TH8547) - A system to measure reverse recovery time and stored charge at ultrafast power diodes

✍ Scribed by Draghici, F.; Jorda, X.; Brezeanu, G.; Badila, M.; Millan, J.; Godignon, P.

Book ID: 120044564
Publisher: IEEE
Year: 2001
Weight: 229 KB
Edition: 24
Category: Article
ISBN-13: 9780780366664
DOI: 10.1109/SMICND.2001.967508

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