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[IEEE Canadian Conference on Electrical and Computer Engineering, 2005. - Saskatoon, SK, Canada (May 1-4, 2005)] Canadian Conference on Electrical and Computer Engineering, 2005. - Configurable sram macro design to resist total dose effects

✍ Scribed by Li Chen, ; Gingrich, D.M.

Book ID: 118229130
Publisher: IEEE
Year: 2005
Weight: 373 KB
Volume: 0
Category: Article
ISBN-13: 9780780388857
DOI: 10.1109/ccece.2005.1557023

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