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[IEEE Canadian Conference on Electrical and Computer Engineering, 2005. - Saskatoon, SK, Canada (May 1-4, 2005)] Canadian Conference on Electrical and Computer Engineering, 2005. - Characterization and modeling of accumulation-mode MOS varactors

✍ Scribed by Sameni, P.; Siu, C.; Iniewski, K.; Mirabbasi, S.; Djahanshahi, H.; Hamour, M.; Chana, J.

Book ID: 118132267
Publisher: IEEE
Year: 2005
Weight: 517 KB
Volume: 0
Category: Article
ISBN-13: 9780780388857
DOI: 10.1109/ccece.2005.1557277

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