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[IEEE Canadian Conference on Electrical and Computer Engineering 2001. Conference Proceedings - Toronto, Ont., Canada (13-16 May 2001)] Canadian Conference on Electrical and Computer Engineering 2001. Conference Proceedings (Cat. No.01TH8555) - Applying cycle-based simulation technique to VITAL as a VHDL gate level standard

✍ Scribed by Yaran, B.H.; Rahmati, D.; Zebardast, A.S.

Book ID: 126598945
Publisher: IEEE
Year: 2001
Weight: 439 KB
Volume: 2
Category: Article
ISBN-13: 9780780367159
DOI: 10.1109/CCECE.2001.933592

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