[IEEE AUTOTESTCON '94 - Anaheim, CA, USA (20-22 Sept. 1994)] Proceedings of AUTOTESTCON '94 - Monitoring power supply current and using a neural network routine to diagnose circuit faults

✍ Scribed by Kirkland, L.V.; Dean, J.S.

• Book ID: 111912477
• Publisher: IEEE
• Year: 1994
• Weight: 197 KB
• Volume: 0
• Category: Article
• ISBN-13: 9780780319103
• DOI: 10.1109/autest.1994.381556