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[IEEE AUTOTESTCON 2003. IEEE Systems Readiness Technology Conference - Anaheim, CA, USA (22-25 Sept. 2003)] Proceedings AUTOTESTCON 2003. IEEE Systems Readiness Technology Conference. - Model-based prognostic techniques [maintenance applications]

✍ Scribed by Jianhui Luo, ; Namburu, M.; Pattipati, K.; Liu Qiao, ; Kawamoto, M.; Chigusa, S.

Book ID: 120834075
Publisher: IEEE
Year: 2003
Weight: 793 KB
Category: Article
ISBN-13: 9780780378377
DOI: 10.1109/AUTEST.2003.1243596

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