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[IEEE ASP-DAC 2005. Asia and South Pacific Design Automation Conference 2005 - Shanghai, China (18-21 Jan. 2005)] Proceedings of the ASP-DAC 2005. Asia and South Pacific Design Automation Conference, 2005. - Automatic functional test program generation for microprocessor verification

✍ Scribed by Tun Li, ; Dan Zhu, ; Lei Liang, ; Yang Guo, ; SiKun Li,

Book ID: 111928467
Publisher: IEEE
Year: 2005
Weight: 703 KB
Volume: 2
Category: Article
ISBN-13: 9780780387362
DOI: 10.1109/aspdac.2005.1466518

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