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[IEEE ARFTG 63rd Conference, Spring 2004 - Fort Worth, TX (June 11, 2004)] ARFTG 63rd Conference, Spring 2004 - Advanced on-wafer multiport calibration methods for mono- and mixed-mode device characterization

✍ Scribed by Heuermann, H.; Rumiantsev, A.; Schott, S.

No coin nor oath required. For personal study only.

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