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[IEEE Annual Symposium Reliability and Maintainability, 2004 - RAMS - Los Angeles, CA, USA (Jan. 26-29, 2004)] Annual Symposium Reliability and Maintainability, 2004 - RAMS - Determining evaluation criteria for a "seal of approval" process for probabilistic risk assessment analysis tools

✍ Scribed by Donohue, S.K.; Dugan, J.B.; Railsback, J.W.; Roelant, H.

Book ID: 126728399
Publisher: IEEE
Year: 2004
Weight: 431 KB
Category: Article
ISBN-13: 9780780382152
DOI: 10.1109/RAMS.2004.1285492

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