𝔖 Bobbio Scriptorium

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[IEEE Annual Symposium Reliability and Maintainability, 2004 - RAMS - Los Angeles, CA, USA (Jan. 26-29, 2004)] Annual Symposium Reliability and Maintainability, 2004 - RAMS - Parametric fault trees with dynamic gates and repair boxes

✍ Scribed by Bobbio, A.; Codetta R., D.

Book ID: 120628622
Publisher: IEEE
Year: 2004
Weight: 647 KB
Category: Article
ISBN-13: 9780780382152
DOI: 10.1109/RAMS.2004.1285491

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