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[IEEE Annual Reliability and Maintainability Symposium. - Philadelphia, PA, USA (22-25 Jan. 2001)] Annual Reliability and Maintainability Symposium. 2001 Proceedings. International Symposium on Product Quality and Integrity (Cat. No.01CH37179) - Software failure modes and effects analysis for a small embedded control system

✍ Scribed by Bowles, J.B.; Wan, C.

Book ID: 121731657
Publisher: IEEE
Year: 2001
Weight: 590 KB
Category: Article
ISBN-13: 9780780366152
DOI: 10.1109/RAMS.2001.902433

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