𝔖 Bobbio Scriptorium

✦ LIBER ✦

[IEEE Annual Reliability and Maintainability Symposium. - Philadelphia, PA, USA (22-25 Jan. 2001)] Annual Reliability and Maintainability Symposium. 2001 Proceedings. International Symposium on Product Quality and Integrity (Cat. No.01CH37179) - A benchmark for quantitative fault tree reliability analysis

✍ Scribed by Zhu, H.; Zhou, S.; Dugan, J.B.; Sullivan, K.J.

Book ID: 120562250
Publisher: IEEE
Year: 2001
Weight: 691 KB
Category: Article
ISBN-13: 9780780366152
DOI: 10.1109/RAMS.2001.902447

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

[IEEE Annual Reliability and Maintainabi

[IEEE Annual Reliability and Maintainability Symposium. - Philadelphia, PA, USA (22-25 Jan. 2001)] Annual Reliability and Maintainability Symposium. 2001 Proceedings. International Symposium on Product Quality and Integrity (Cat. No.01CH37179) - Uncertainty analysis in reliability modeling

✍ Liang Yin, ; Smith, M.A.J.; Trivedi, K.S. 📂 Article 📅 2001 🏛 IEEE ⚖ 592 KB

[IEEE Annual Reliability and Maintainabi

[IEEE Annual Reliability and Maintainability Symposium. - Philadelphia, PA, USA (22-25 Jan. 2001)] Annual Reliability and Maintainability Symposium. 2001 Proceedings. International Symposium on Product Quality and Integrity (Cat. No.01CH37179) - Reliability centered maintenance and risk assessment

✍ Hauge, B.S.; Johnston, D.C. 📂 Article 📅 2001 🏛 IEEE ⚖ 532 KB

[IEEE Annual Reliability and Maintainabi

[IEEE Annual Reliability and Maintainability Symposium. - Philadelphia, PA, USA (22-25 Jan. 2001)] Annual Reliability and Maintainability Symposium. 2001 Proceedings. International Symposium on Product Quality and Integrity (Cat. No.01CH37179) - Reliability optimization models for fault-tolerant distributed systems

✍ Wattanapongsakorn, N.; Levitan, S. 📂 Article 📅 2001 🏛 IEEE ⚖ 712 KB

[IEEE Annual Reliability and Maintainabi

[IEEE Annual Reliability and Maintainability Symposium. - Philadelphia, PA, USA (22-25 Jan. 2001)] Annual Reliability and Maintainability Symposium. 2001 Proceedings. International Symposium on Product Quality and Integrity (Cat. No.01CH37179) - Fault-tree analysis considering latency of basic events

✍ Kohda, T.; Inoue, K. 📂 Article 📅 2001 🏛 IEEE ⚖ 382 KB

[IEEE Annual Reliability and Maintainabi

[IEEE Annual Reliability and Maintainability Symposium. - Philadelphia, PA, USA (22-25 Jan. 2001)] Annual Reliability and Maintainability Symposium. 2001 Proceedings. International Symposium on Product Quality and Integrity (Cat. No.01CH37179) - System with time-redundancy

✍ Langer, Y. 📂 Article 📅 2001 🏛 IEEE ⚖ 353 KB

[IEEE Annual Reliability and Maintainabi

[IEEE Annual Reliability and Maintainability Symposium. - Philadelphia, PA, USA (22-25 Jan. 2001)] Annual Reliability and Maintainability Symposium. 2001 Proceedings. International Symposium on Product Quality and Integrity (Cat. No.01CH37179) - Simulation in RCM training

✍ Johnson, D.C. 📂 Article 📅 2001 🏛 IEEE ⚖ 512 KB