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[IEEE Annual Reliability and Maintainability Symposium - Philadelphia, PA, USA (13-16 Jan. 1997)] Annual Reliability and Maintainability Symposium - Considering risk profiles in design optimization for series-parallel systems

โœ Scribed by Coit, D.W.; Smith, A.E.


Book ID
115508082
Publisher
IEEE
Year
1997
Weight
698 KB
Volume
0
Category
Article
ISBN-13
9780780337831

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