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[IEEE Annual Reliability and Maintainability Symposium, 2005. - Alexandria, VA, USA (Jan. 24-27, 2005)] Annual Reliability and Maintainability Symposium, 2005. Proceedings. - Multiple failure mode and effects analysis - an approach to risk assessment of multiple failures with FMEA

✍ Scribed by Pickard, K.; Muller, P.; Bertsche, B.

Book ID: 125452232
Publisher: IEEE
Year: 2005
Tongue: English
Weight: 569 KB
Category: Article
ISBN-13: 9780780388246
DOI: 10.1109/rams.2005.1408405

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