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[IEEE Annual Reliability and Maintainability Symposium. 1991 - Orlando, FL, USA (29-31 Jan. 1991)] Annual Reliability and Maintainability Symposium. 1991 Proceedings - Analysis of contaminated field failure data for repairable systems

✍ Scribed by Hanen, C.K.; Thyregod, P.

Book ID: 126675850
Publisher: IEEE
Year: 1991
Weight: 496 KB
Category: Article
ISBN-13: 9780879426613
DOI: 10.1109/ARMS.1991.154506

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