𝔖 Bobbio Scriptorium

✦ LIBER ✦

[IEEE Annual on Reliability and Maintainability Symposium - Los Angeles, CA, USA (23-25 Jan. 1990)] Annual Proceedings on Reliability and Maintainability Symposium - Fault tree analysis-using spreadsheet

✍ Scribed by Liu, M.C.

Book ID: 126705179
Publisher: IEEE
Year: 1990
Weight: 262 KB
Category: Article
DOI: 10.1109/ARMS.1990.68011

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

[IEEE Annual on Reliability and Maintain

[IEEE Annual on Reliability and Maintainability Symposium - Los Angeles, CA, USA (23-25 Jan. 1990)] Annual Proceedings on Reliability and Maintainability Symposium - Fault trees and sequence dependencies

✍ Dugan, J.B.; Bavuso, S.J.; Boyd, M.A. 📂 Article 📅 1990 🏛 IEEE ⚖ 563 KB

[IEEE Annual on Reliability and Maintain

[IEEE Annual on Reliability and Maintainability Symposium - Los Angeles, CA, USA (23-25 Jan. 1990)] Annual Proceedings on Reliability and Maintainability Symposium - Reliability prediction of electronic packages

✍ Dasgupta, A.; Barker, D.; Pecht, M. 📂 Article 📅 1990 🏛 IEEE ⚖ 665 KB

[IEEE Annual on Reliability and Maintain

[IEEE Annual on Reliability and Maintainability Symposium - Los Angeles, CA, USA (23-25 Jan. 1990)] Annual Proceedings on Reliability and Maintainability Symposium - Evaluating the reliability of repairable systems

✍ Crow, L.H. 📂 Article 📅 1990 🏛 IEEE ⚖ 463 KB

[IEEE Annual on Reliability and Maintain

[IEEE Annual on Reliability and Maintainability Symposium - Los Angeles, CA, USA (23-25 Jan. 1990)] Annual Proceedings on Reliability and Maintainability Symposium - Bounding and approximating Markov models

✍ Laemmel, A.E.; Shooman, M.L. 📂 Article 📅 1990 🏛 IEEE ⚖ 479 KB

[IEEE Annual on Reliability and Maintain

[IEEE Annual on Reliability and Maintainability Symposium - Los Angeles, CA, USA (23-25 Jan. 1990)] Annual Proceedings on Reliability and Maintainability Symposium - Field failures of electronic systems

✍ Rimestad, L. 📂 Article 📅 1990 🏛 IEEE ⚖ 535 KB

[IEEE Annual on Reliability and Maintain

[IEEE Annual on Reliability and Maintainability Symposium - Los Angeles, CA, USA (23-25 Jan. 1990)] Annual Proceedings on Reliability and Maintainability Symposium - Reliability assurance of application-specific microelectronic circuits

✍ Sheu, B.J.; Hsu, W.-J.; Tyree, V. 📂 Article 📅 1990 🏛 IEEE ⚖ 673 KB