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[IEEE Annual Conference on Reliability and Maintainability (RAMS) - Tampa, FL, USA (27-30 Jan. 2003)] Annual Reliability and Maintainability Symposium, 2003. - A process for failure modes and effects analysis of computer software

✍ Scribed by Ozarin, N.; Siracusa, M.

Book ID: 125522669
Publisher: IEEE
Year: 2003
Weight: 339 KB
Category: Article
ISBN-13: 9780780377172
DOI: 10.1109/RAMS.2003.1182016

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