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[IEEE Annual Conference on Reliability and Maintainability (RAMS) - Tampa, FL, USA (27-30 Jan. 2003)] Annual Reliability and Maintainability Symposium, 2003. - Representing complex systems within discrete event simulation for reliability assessment

✍ Scribed by Warrington, L.; Jones, J.A.

Book ID: 118013999
Publisher: IEEE
Year: 2003
Weight: 394 KB
Volume: 0
Category: Article
ISBN-13: 9780780377172
DOI: 10.1109/rams.2003.1182037

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