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[IEEE Annual Conference on Electrical Insulation and Dielectric Phenomena - Pocono Manor, PA, USA (28-31 Oct. 1990)] Annual Conference on Electrical Insulation and Dielectric Phenomena - Dynamic arc modeling of DC flashover under contaminated conditions

✍ Scribed by Sundararajan, R.; Gorur, R.S.

Book ID: 120941570
Publisher: IEEE
Year: 1990
Weight: 185 KB
Category: Article
DOI: 10.1109/CEIDP.1990.201397

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