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[IEEE 8th Euromicro Conference on Digital System Design (DSD'05) - Porto, Portugal (30-03 Aug. 2005)] 8th Euromicro Conference on Digital System Design (DSD'05) - Power-Constrained Hybrid BIST Test Scheduling in an Abort-on-First-Fail Test Environment

โœ Scribed by Zhiyuan He, ; Jervan, G.; Zebo Peng, ; Eles, P.


Book ID
120271699
Publisher
IEEE
Year
2005
Weight
165 KB
Category
Article
ISBN-13
9780769524337

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