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[IEEE 7th International Multi Topic Conference, 2003. INMIC 2003. - Islamabad, Pakistan (8-9 Dec. 2003)] 7th International Multi Topic Conference, 2003. INMIC 2003. - Generation-recombination noise characteristics of GaAs MESFETs

✍ Scribed by lqbal, M.A.; Khan, S.H.

Book ID: 121674537
Publisher: IEEE
Year: 2003
Tongue: English
Weight: 261 KB
Category: Article
ISBN-13: 9780780381834
DOI: 10.1109/INMIC.2003.1416694

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